“Field Emission Scanning Electron Microscope”
CIQTEK FIB-SEM Practical Demonstration - Preparation of Transmission Specimen of Ferrite-Martensite Steel
CIQTEK FIB-SEM Practical Demonstration Focused Ion Beam Scanning Electron Microscope (FIB-SEM) are essential for various applications such as defect diagnosis, repair, ion implantation, in-situ processing, mask repair, etching, integrated circuit design modification, chip device fabrication,...
The Science Behind Color Change in Lizards Insights from CIQTEK Field Emission Scanning Electron Microscope
In the fascinating world of nature, lizards are renowned for their remarkable ability to change colors. These vibrant hues not only captivate our attention but also play a crucial role in the survival and reproduction of lizards. But what scientific principles underlie these dazzling colors? This...