“DB550”

CIQTEK FIB-SEM Practical Demonstration - Preparation of Transmission Specimen of Ferrite-Martensite Steel

CIQTEK FIB-SEM Practical Demonstration Focused Ion Beam Scanning Electron Microscope (FIB-SEM) are essential for various applications such as defect diagnosis, repair, ion implantation, in-situ processing, mask repair, etching, integrated circuit design modification, chip device fabrication,...